
DS4830A User’s Guide
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8.2 – Sample and Hold Register Descriptions
The sample and hold has two SFRs. These are Sample and Hold Control Register (SHCN) and Sample and Hold
Internal Trigger Enable register (SENR). The SHCN register controls both sample and holds. The SENR controls
the internal sample pulse for both sample and holds. The sample and hold SFRs are located in module 4.
8.2.1 – Sample and Hold Control Register (SHCN)
STOP Sample Control. These bits control the end of the sample and hold sampling
relative to the SHEN0 and SHEN1 pulse.
Falling Edge of SHEN0/SHEN1
300ns after rising edge of SHEN0/SHEN1
350ns after rising edge of SHEN0/SHEN1
450ns after rising edge of SHEN0/SHEN1
550ns after rising edge of SHEN0/SHEN1
750ns after rising edge of SHEN0/SHEN1
1us after rising edge of SHEN0/SHEN1
1.5us after rising edge of SHEN0/SHEN1
1.75us after rising edge of SHEN0/SHEN1
2us after rising edge of SHEN0/SHEN1
2.5us after rising edge of SHEN0/SHEN1
4us after rising edge of SHEN0/SHEN1
5us after rising edge of SHEN0/SHEN1
Falling Edge of SHEN0/SHEN1
21 ext-clock after rising edge of SHEN0/SHEN1
22 ext-clock after rising edge of SHEN0/SHEN1
23 ext-clock after rising edge of SHEN0/SHEN1
24 ext-clock after rising edge of SHEN0/SHEN1
25 ext-clock after rising edge of SHEN0/SHEN1
26 ext-clock after rising edge of SHEN0/SHEN1
27 ext-clock after rising edge of SHEN0/SHEN1
28 ext-clock after rising edge of SHEN0/SHEN1
29 ext-clock after rising edge of SHEN0/SHEN1
30 ext-clock after rising edge of SHEN0/SHEN1
31 ext-clock after rising edge of SHEN0/SHEN1
32 ext-clock after rising edge of SHEN0/SHEN1
33 ext-clock after rising edge of SHEN0/SHEN1
34 ext-clock after rising edge of SHEN0/SHEN1
35 ext-clock after rising edge of SHEN0/SHEN1
Note: A minimum sample time of 300nSec must be used when external clock is
used to guarantee accurate results.
Fast Mode Enable. Setting this bit to ‘1’ enables the fast operation for Sample and Hold
0. In this mode, Sample and Hold 0 is guaranteed to get a conversion slot in the ADC
conversion sequence every 125µs and the user can issue sample pulses at an interval
of 125µs. During fast mode, the sample and hold conversion priority is increased over
voltage channels in the sequence and the voltage conversions will be delayed. When
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